Scanning Electron Microscope (SEM) of Leaf Cell Morphology and Inheritance for Corn Leaf Aphid (CLA) Resistance in Maize

Presenter Information

Hee-chung Ji, National Institute of Animal Science, South KoreaFollow
Joung-kyong Lee, National Institute of Animal Science, South Korea
B. R. Sung, National Institute of Animal Science, South Korea
K. Y. Kim, National Institute of Animal Science, South Korea
K. J. Choi, National Institute of Animal Science, South Korea
Keun-bal Lim, National Institute of Animal Science, South Korea
W. H. Kim, National Institute of Animal Science, South Korea
Sung Seo, National Institute of Animal Science, South Korea

Citation

Ji, Hee-chung; Lee, Joung-kyong; Sung, B. R.; Kim, K. Y.; Choi, K. J.; Lim, Keun-bal; Kim, W. H.; and Seo, Sung, "Scanning Electron Microscope (SEM) of Leaf Cell Morphology and Inheritance for Corn Leaf Aphid (CLA) Resistance in Maize" (2021). IGC Proceedings (1993-2023). 37.
https://uknowledge.uky.edu/igc/21/12-1/37