Track 12-1: Developing Improved Plants
Publication Date
2008
Location
China
Citation
Ji, Hee-chung; Lee, Joung-kyong; Sung, B. R.; Kim, K. Y.; Choi, K. J.; Lim, Keun-bal; Kim, W. H.; and Seo, Sung, "Scanning Electron Microscope (SEM) of Leaf Cell Morphology and Inheritance for Corn Leaf Aphid (CLA) Resistance in Maize" (2008). IGC Proceedings (1985-2023). 37.
(URL: https://uknowledge.uky.edu/igc/21/12-1/37)
Included in
Agricultural Science Commons, Agronomy and Crop Sciences Commons, Plant Biology Commons, Plant Pathology Commons, Soil Science Commons, Weed Science Commons
Scanning Electron Microscope (SEM) of Leaf Cell Morphology and Inheritance for Corn Leaf Aphid (CLA) Resistance in Maize
China
