Abstract
Nanostructured bi-layer graphene samples formed through catalytic etching are investigated with electrostatic force microscopy. The measurements and supporting computations show a variation in the microscopy signal for different nano-domains that are indicative of changes in capacitive coupling related to their small sizes. Abrupt capacitance variations detected across etch tracks indicates that the nano-domains have strong electrical isolation between them. Comparison of the measurements to a resistor-capacitor model indicates that the resistance between two bi-layer graphene regions separated by an approximately 10 nm wide etch track is greater than about 1×1012 Ω with a corresponding gap resistivity greater than about 3×1014 Ω⋅nm . This extremely large gap resistivity suggests that catalytic etch tracks within few-layer graphene samples are sufficient for providing electrical isolation between separate nano-domains that could permit their use in constructing atomically thin nanogap electrodes, interconnects, and nanoribbons.
Document Type
Article
Publication Date
12-18-2014
Digital Object Identifier (DOI)
http://dx.doi.org/10.1063/1.4904709
Funding Information
The work was supported in part by the National Science Foundation (NSF) through Grant No. DMR-0805136, the Kentucky NSF EPSCoR program through Award No. EPS-0814194, the University of Kentucky (UK) Center for Advanced Materials (CAM), a grant from the Kentucky Science and Engineering Foundation as per Grant/Award Agreement No. KSEF-2928-RDE-016 with the Kentucky Science and Technology Corporation, and a Research Support Grant from the University of Kentucky Office of the Vice President for Research.
Repository Citation
Hunley, D. Patrick; Sundararajan, Abhishek; Boland, Mathias J.; and Strachan, Douglas R., "Electrostatic Force Microscopy and Electrical Isolation of Etched Few-Layer Graphene Nano-Domains" (2014). Physics and Astronomy Faculty Publications. 243.
https://uknowledge.uky.edu/physastron_facpub/243
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Notes/Citation Information
Published in Applied Physics Letters, v. 105, no. 24, article 243109, p. 1-5.
Copyright 2014 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
The following article appeared in Applied Physics Letters, v. 105, no. 24, article 243109, p. 1-5 and may be found at http://dx.doi.org/10.1063/1.4904709.