US Patent Number
6003150
Publication Date
12-14-1999
Abstract
A method of testing field programmable gate arrays (FPGAs) includes the step of configuring programmable logic blocks of the FPGAs for completing a built-in self-test. This is followed by the steps of initiating the built-in self-test, generating test patterns with the programmable logic blocks and analyzing a resulting response to produce a pass/fail indication with the programmable logic blocks. More specifically, the configuring step includes establishing a first group of programmable logic blocks as test pattern generators and output response analyzers and a second group of programmable logic blocks as blocks under test. The blocks under test are then repeatedly recongifured in order to completely test each block under test in all possible modes of operation. The programming of the first and second groups of programmable logic blocks is then reversed and the testing of each new block under test is then completed.
Assignees
Lucent Technologies Inc., Murray Hill, N.J., University of Kentucky Research Foundation, Lexington, Ky.
Application Number
08/974,799
Filing Date
11/20/1997
Recommended Citation
Stroud, Charles E. and Abramovici, Miron, "Method for Testing Field Programmable Gate Arrays" (1999). Electrical and Computer Engineering Faculty Patents. 10.
https://uknowledge.uky.edu/ece_patents/10
