US Patent Number
6688162
Publication Date
2-10-2004
Abstract
An apparatus for determining elasticity characteristics of a thin-film layer. The apparatus comprises a sensor element having a base magnetostrictive element at least one surface of which is at least partially coated with the thin-film layer. The thin-film layer may be of a variety of materials (having a synthetic and/or bio-component) in a state or form capable of being deposited, manually or otherwise, on the base element surface, such as by way of eye-dropper, melting, dripping, brushing, sputtering, spraying, etching, evaporation, dip-coating, laminating, etc. Among suitable thin-film layers for the sensor element of the invention are fluent bio-substances, thin-film deposits used in manufacturing processes, polymeric coatings, paint, an adhesive, and so on. A receiver, preferably remotely located, is used to measure a plurality of values for magneto-elastic emission intensity of the sensor element in either characterization: (a) the measure of the plurality of values is used to identify a magneto-elastic resonant frequency value for the sensor element; and (b) the measure of the plurality of successive values is done at a preselected magneto-elastic frequency.
Assignees
University of Kentucky Research Foundation, Lexington, KY (US)
Application Number
10/067,681
Filing Date
10/20/2001
Recommended Citation
Bachas, Leonidas G.; Barrett, Gary; Grimes, Craig A.; Kouzoudis, Dimitris; and Schmidt, Stephan, "Magnetoelastic Sensor for Characterizing Properties of Thin-Film/Coatings" (2004). Chemistry Faculty Patents. 26.
https://uknowledge.uky.edu/chemistry_patents/26
