Scanning Electron Microscope (SEM) of Leaf Cell Morphology and Inheritance for Corn Leaf Aphid (CLA) Resistance in Maize

Presenter Information

• Hee-chung Ji, National Institute of Animal Science, South KoreaFollow
• Joung-kyong Lee, National Institute of Animal Science, South Korea
• B. R. Sung, National Institute of Animal Science, South Korea
• K. Y. Kim, National Institute of Animal Science, South Korea
• K. J. Choi, National Institute of Animal Science, South Korea
• Keun-bal Lim, National Institute of Animal Science, South Korea
• W. H. Kim, National Institute of Animal Science, South Korea
• Sung Seo, National Institute of Animal Science, South Korea

Publication Date

2008

Location

China

Citation

Ji, Hee-chung; Lee, Joung-kyong; Sung, B. R.; Kim, K. Y.; Choi, K. J.; Lim, Keun-bal; Kim, W. H.; and Seo, Sung, "Scanning Electron Microscope (SEM) of Leaf Cell Morphology and Inheritance for Corn Leaf Aphid (CLA) Resistance in Maize" (2008). IGC Proceedings (1977-2023). 37.
(URL: https://uknowledge.uky.edu/igc/21/12-1/37)