Date Available
12-7-2011
Year of Publication
2007
Document Type
Thesis
College
Engineering
Department
Electrical Engineering
First Advisor
Todd Hastings
Abstract
Bending loss in silicon-on-insulator rib waveguides was calculated using conformal mapping of the curved waveguide to an equivalent straight waveguide. Finite-element analysis with perfectly matched layer boundaries was used to solve the vector wave equation. Transmission loss was experimentally measured as a function of bend radius for several SOI waveguides. Good agreement was found between simulated and measured losses, and this technique was confirmed as a good predictor for loss and for minimum bend radius for efficient design.
Recommended Citation
Srinivasan, Harish, "FINITE ELEMENT ANALYSIS AND EXPERIMENTAL VERIFICATION OF SOI WAVEGUIDE LOSSES" (2007). University of Kentucky Master's Theses. 485.
https://uknowledge.uky.edu/gradschool_theses/485
