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Track 12-1: Developing Improved Plants

Scanning Electron Microscope (SEM) of Leaf Cell Morphology and Inheritance for Corn Leaf Aphid (CLA) Resistance in Maize

Hee-chung Ji, National Institute of Animal Science, South KoreaFollow
Joung-kyong Lee, National Institute of Animal Science, South Korea
B. R. Sung, National Institute of Animal Science, South Korea
K. Y. Kim, National Institute of Animal Science, South Korea
K. J. Choi, National Institute of Animal Science, South Korea
Keun-bal Lim, National Institute of Animal Science, South Korea
W. H. Kim, National Institute of Animal Science, South Korea
Sung Seo, National Institute of Animal Science, South Korea

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Plant Sciences Commons, Soil Science Commons

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Scanning Electron Microscope (SEM) of Leaf Cell Morphology and Inheritance for Corn Leaf Aphid (CLA) Resistance in Maize