Date Available


Year of Publication


Degree Name

Master of Science in Electrical Engineering (MSEE)

Document Type





Electrical Engineering

First Advisor

Dr. Laurence G. Hassebrook


Multi Frequency Phase Measuring Profilometry is the most popular lateral contact 3-D Scanning technique. The Phase Measuring Profilometry is limited in resolution by the projector and cameras used. Conventional signal projectors have a maximum of 2000 to 4000 scan lines limiting the projector resolution. To obtain greater detail with higher resolution the PMP technique is applied to a Spatial Light Modulator (SLM) having 12000 lines, very large as compared to conventional projectors. This technology can achieve super resolution scans having varied applications. Scans achieved from PMP suffer from a certain type of artifact called “banding” which are periodic bands across the captured target. This leads to incorrect measurement of surfaces. Banding is the most limiting noise source in PMP because it increases with lower frequency and decrease in number of patterns. The requirement for lager number of patterns increases the possibility of motion banding. The requirement for higher frequency leads to the necessity for multifrequency PMP which, again leads to more patterns and longer scan times. We aim to reduce the banding by correcting the phase of the captured data.