US Patent Number

8042405

Publication Date

10-25-2011

Abstract

A method of predicting sheet formability at a microscale level includes the steps of providing a grid pattern on a test sheet, bulging the test sheet to a hemispherical shape until a crack is initiated on the surface of the test sheet, detecting the initiation of the crack, acquiring two images of the surface adjacent to the crack and calculating surface strains on the test sheet.

Assignees

University of Kentucky Research Foundation, Lexington, KY (US)

Application Number

12/177,968

Filing Date

2008-07-23

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